On Sale! Ando AQ-6317B Spectrum Analyzer Model AQ6317B Ando AQ

Ando AQ-6317B Spectrum Analyzer

High-accuracy and high-resolution optical spectrum analyzerfor evaluating D-WDM systems and components.

The AQ6317B is an advanced optical spectrum analyzer for a wide range of applications, including light source evaluation, measurement of loss wave length characteristics in optical devices, and waveform analysis of WDM (Wavelength Division Multiplexing) systems. Especially at C-band and L-band, the unit achieves high wave length accuracy and wave length linearity, and can evaluate optical devices for WDM. Analysis functions make operation and expandability simple.The AQ6317B contains the latest Ando technology for optical spectrum analyzers. A reference equipment for the next generation.In comparison with the former model, the wavelength accuracy of the AQ6317B has been improved to ±20 pm,and it is specified as for the L-band as well. WDM analysis function and notch width analysis function are improved,and multi-channel NF analysis function and optical filter analysis function are newly added. It has become much easier to use with other improvements, such as sweep speed-up.

Features

Wide dynamic range for 50 GHz WDM-Signals

The dynamic range is 70 dB at peak ±0.4 nm, and 60 dB at peak ±0.2 nm. High-resolution measurement achieves wide dynamicrange with 50 GHz spacing WDM system.

High wavelength accuracy

Provides ±0.02 nm wavelength accuracy at 1520 to1580 nm, and ±0.04 nm at 1580 to 1620 nm, with±0.01 nm wavelength linearity, making it especially usefulfor high-precision loss wavelength characteristics andother evaluation of WDM devices.The wavelength scale indicates both in air and in vacuum.

High wavelength resolution

Achieves wavelength resolution of 0.015 nm

Versatile analysis functions

Analysis functions for WDM and other optical devices(LD, LED, FBG, etc.).

Synchronous sweep

In conjunction with an AQ4321 Tunable Laser Source, much higher wavelength resolution/wide dynamic range can be achieved by high-speed synchronous sweep.

High Sensitivity

High sensitivity allows measurement of light at down to -90 dBm, covering from 1200 to 1650 nm.

Low polarization dependency

Measurements such as gain of optical amplifier can be proceeded accurately because polarization dependency is suppressed as low as ±0.05 dB.

High-level accuracy

Accurate within ±0.3 dB.

High power measurement: Max. +20 dBm (100 mW)

Even high-power output from an optical amplifier can be measured directly without an optical attenuator.

9.4-inch color LCD

Pulsed light can be measured

Three individual trace memories

Applications

Optical Multiplexer evaluation

In conjunction with the AQ4321 Tunable Laser Source,the AQ6317B can achieve high wave length resolution/wide dynamic range with high-speed synchronous sweep function, and result insertion loss, passed central wave length and linearity as evaluation parameter of optical MUX/DEMUX.

Optical fiber amplifier (EDFA) evaluation

The ASE interpolation method is used to measure gain and NF, key parameters for optical fiber amplifier evaluation.In conjunction with the AQ8423Z optical amplifier analyzer, the system can accurately measure gain and NF with the pulse method, which is optimum for evaluation of WDM optical fiber amplifiers.

Specifications

Applicable fibers	SMF, GI (50/125 μm)
Measurement wavelength range	600 to 1750 nm

Wavelength accuracy	±0.02 nm (1520 to 1580 nm , after calibration with build-in reference light source)±0.04 nm (1580 to 1620 nm , after calibration with build-in reference light source)±0.5 nm (600 to 1750 nm
Wavelength linearity	±0.01 nm (1520 to 1580 nm) ±0.02 nm (1580 to 1620 nm)
Wavelength repeatability	±0.005 nm (1 min)
Wavelength resolution	Max. resolution: 0.015 nm or better (1520 to 1620 nm, resolution setting: 0.01 nm)Resolution setting: 0.01, 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0 nm
Resolution accuracy	±5 %: (1300 to 1650 nm, resolution: 0.05 nm or more, resolution correction: ON)
Measurement level range	-90 to +20 dBm (1200 to 1650 nm, sensitivity: HIGH3) -80 to +20 dBm (1000 to 1200 nm, sensitivity: HIGH3) -60 to +20 dBm (600 to 1000 nm, sensitivity: HIGH3)
Level accuracy	±0.3 dB (1310/1550 nm, input: -30 dBm, sensitivity:HIGH1-3)
Level linearity	±0.05 dB (input: +10 to -50 dBm, sensitivity: HIGH1-3)
Level flatness	±0.1 dB (1520 to 1580 nm), ±0.2 dB (1580 to 1620 nm)
Polarization dependency	±0.05 dB (1550/1600 nm), ±0.05 dB typ. (1310 nm)
Dynamic range	60 dB (1523 nm, peak ±0.2 nm, resolution: 0.01 nm) 70 dB (1523 nm, peak ±0.4 nm, resolution: 0.01 nm) 45 dB (1523 nm, peak ±0.2 nm, resolution: 0.1 nm)
Sweep time	Approx. 500 ms (Span: 100 nm or less, sensitivity: NORM, HOLD, ave.: 1, 501 samples ,resolution correction: OFF) Approx. 0.5 min (Span: 100 nm or less, sensitivity: HIGH2, ave.: 1, 501 samples, No signal)
Function
Automatic Measurement	Program function (20 program, 200 steps), Long-term measurement function
Setting of measurement conditions	Span setting: 0 to 1200 nm Measuring sensitivity setting: NORMAL HOLD/AUTO, MID, HIGH1/2/3 Number of averaging setting: 1 to 1000 timesSample number setting: 11 to 20001, AUTO Automatic setting function of measuring conditions Sweep-between-marker function 0 nm sweep function Pulse light measurement function Air/vacuum wavelength measurement function TLS synchronized measurement function
Trace Display	Level scale setting: 0.1 to 10 dB/div, linear Simultaneous display of 3 independent traces Max./Min. hold display Roll averaging display Calculation-between-traces display Normalized display Curve-fit display 3D display Split display Power density display, % display, dB/km display Frequency display of horizontal axis scale
Data analysis	WDM waveform analysis (Wavelength/Level/SNR list display), Optical fiber amplifier analysis (GAIN/NF, Single/Multi channel), PMD analysis, Optical filter analysis, DFB-LD analysis, FP-LD analysis, LED analysis, SMSR analysis, Peak search, bottom search, spectral width search, notch width search Delta marker (max. 200), line marker (analysis range specification) Graph display of long-term measurement result
Others	Self-wavelength calibration function (using built-in reference light source)Wavelength/Level compensation function, label function, help function
Memory
Built-in FDD	3.5-inch 2HD
Internal memory	32 Traces, 20 programs
File format	Trace file, program file, measuring condition file,Text file (trace, analysis data, etc.),Graphics file (BMP,TIFF)
Data output
Printer	Built in high speed printer
Interface
Remote control	GP-IB (2 ports)TLS control interfaces (TTL)
Others	Sweep trigger input (TTL) Sample enable input (TTL) Sample trigger input (TTL) Analog output (0 to 5 V)Video output (VGA)
Display	9.4-inch color LCD (Resolution: 640 x 480 dots)
Optical connector	FC (Standard)
Power requirement	AC 100 to 120/200 to 240 V, 50/60 Hz
Environmental conditions	Operating temperature: 5 to 40 ºC Storage temperature: -10 to +50 ºC Humidity: 80 %RH or less (No condensation)
Dimensions and mass	Approx. 425 (W) x 222 (H) x 450 (D) mm, approx. 30 kg

For full Ando AQ-6317B Spectrum Analyzer product specifications, please click here: AQ-6317B

Additional Information

Ando AQ-6317B Optical Spectrum Analyzer

High-accuracy and high-resolution optical spectrum analyzer for evaluating D-WDM systems and components.

Includes Accessories As Listed!

BC# -L/T*

Ando AQ-6317B AQ6317B Spectrum Analyzer Models On Sale Warranty Calibration Backed by The Best Service and Lowest Prices in the Industry.

Included

Ando AQ-6317B Optical Spectrum Analyzer (BC# -L/T*)
Power Cord
User Manual On CD Rom

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Datasheet

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Ando AQ-6317B Optical Spectrum Analyzer 600 - 1750nm