Anritsu 37397D 65GHz Vector Network Analyzer w/ Opt 15
Condition: Refurbished / Calibrated
Warranty: 1 Year Warranty
Anritsu 37397D Vector Network Analyzer
The 37000D Lightning™ Vector Network Analyzers are high performance test tools enhanced to better satisfy the growing needs of defense, satellite, radar, broadband communication, and high speed component markets. The new 37000D VNAs improve upon performance while providing a wider set of standard application features to better suit the needs of R&D engineers working on next generation designs. These new features, when combined with the ease of programming through helpful software utilities and faster data transfer over Ethernet, make it an equally valuable tool for manufacturing as well.
Premium Models (37300D)
The Premium models are designed for active and passive device applications, where versatility is the main priority. These are high performance two-port VNAs that include step attenuators, internal bias tees, a gain compression application and wider power range as standard features.
They are available in four different frequency ranges, namely 20 GHz (37347D), 40 GHz (37369D), 50 GHz (37377D) and 65 GHz (37397D). Each model can also be configured as an ME7808B millimeter-wave VNA by simply adding a millimeter-wave test set, two synthesizers and the desired mmW modules. The 37397D VNA is also directly upgradeable to a ME7808B Broadband (40 MHz to 110 GHz) VNA.
Frequency Translated Measurements
All Lightning D VNAs have the Multiple Source Control feature, which allows the user to set different frequencies for the source and the receiver. This feature when paired with the Flexible test set (Option 15), which provides direct access to the four samplers, enables measurements of conversion loss, port match, isolation, relative group delay, amplitude tracking and phase tracking for frequency translation devices such as mixers, upconverters, and downconverters. In addition, the built-in NxN mixer calibration utility provides guided steps on performing a calibration for error-corrected measurements of magnitude, phase and group delay of mixers.
E/O and O/E Measurements
The 37000D VNAs incorporate an E/O and O/E measurement application that simplifies VNA calibration when measuring E/O and O/E devices. This enables characterization of the transfer function, group delay, and return loss of optical modulators (E/O) and photoreceivers (O/E). An MN4765A O/E calibration module (65 GHz) and an Anritsu laser source are required to complete the test set-up. The internal VNA application de-embeds the response of the O/E calibration module, to allow direct measurement of the modulator. For O/E measurements, the O/E module is used to characterize a modulator which becomes the reference standard when making photoreceiver measurements.
Gain Compression Measurements
The standard gain compression application in all Lightning D VNAs allows the user to thoroughly characterize the gain compression of amplifiers using swept frequency and swept power routines. By manually increasing the calibrated flat test port power, it is possible to measure the minimum gain compression point within a frequency range. For more traditional gain compression measurements at selected CW frequencies, the application menu guides through the linear port power calibration process. The built-in software will sweep the power and detect the selected compression point at up to ten CW frequencies. The results are then displayed in graphical and tabular format.
Features:
- Multiple Source Control mode and Frequency Offset
- E/O and O/E measurements
- Gain Compression application
- Internal Bias tees
- Extended Power Range (Source Step Attenuator and test port attenuator)
- Rear Panel IF inputs
- NxN Calibration Utility for Mixer Measurements
- Embed/De-Embed Application
- High Stability Frequency Reference
- 1 Hz Frequency Resolution
Specifications:
| Standard | |
| Frequency Range: | 40 MHz to 65 GHz |
| Measurement Parameters: | : S11, S21, S22, S12 User-defined combinations of a1, a2, b1, and b2 |
| Domains: | Frequency Domain, CW Draw, and optional High Speed Time (Distance) Domain. |
| Graph Types: | Log Magnitude, Phase, Log Magnitude and Phase, Smith Chart (Impedance), Smith Chart (Admittance), Linear Polar, Log Polar, Group Delay, Linear Magnitude, Linear Magnitude and Phase, Real, Imaginary, Real and Imaginary, SWR and Power Out. |
| Data Points: | 1601 maximum or N discrete data points where 2 ≤N ≤1601. |
| Limits Lines: | Either single or segmented limit lines can be displayed. Two limit lines are available for each trace. |
| Single Limit Readouts: | Interpolation algorithm determines the exact intersection frequencies of test data and limit lines. |
| Segmented Limits: | A total of 20 segments (10 upper and 10 lower) can be generated per data trace. Complete segmented traces can be offset in both frequency and amplitude. |
| Test Limits: | Both single and segmented limits can be used for PASS/FAIL testing. The active channel's PASS or FAIL status is indicated on the display after each sweep. In addition, PASS/FAIL status is output through the rear panel I/O connector as selectable TTL levels (PASS = 0V, FAIL = +5V or PASS = +5V, FAIL = 0V). |
| Tune mode: | Tune Mode optimizes sweep speed in tuning applications by updating forward S-parameters more frequently than reverse ones. This mode allows the user to select the ratio of forward sweeps to reverse sweeps after a full 12-term calibration. The ratio of forward sweeps to reverse sweeps can be set anywhere between 1:1 and 10,000:1. |
| Data Averaging: | Point-by-point (default) {up to 4096}, Sweep-by-Sweep |
| IF Bandwidth: | 10 kHz to 10 Hz |
| Reference Plane: | Can be entered in time or in distance (when the dielectric constant is entered). Automatic reference plane feature adds the correct electrical length (delay) compensation. Software compensation for the electrical length difference between reference and test is always accurate and stable since measurement frequencies are always synthesized. In addition, the system compensates reference phase delay for dispersive transmission media, such as waveguide and microstrip. |
| Measurement Frequency Range: | Frequency range of the measurement can be narrowed within the calibration range without recalibration. CW mode permits single frequency measurements, also without recalibration. |
| Group Delay Aperture: | Defined as the frequency span over which the phase change is computed at a given frequency point. The aperture can be changed without recalibration. The minimum aperture is the frequency range divided by the number of points in calibration and can be increased to 20% of the frequency range without recalibration. |
| Measurement Channels: | Four independent channels are available to display any S-parameter or user defined parameter, in any format, with up to two traces per channel for a maximum of eight traces simultaneously. A single channel, two channels (1 and 3, or 2 and 4), or all four channels can be displayed simultaneously. Channels 1 and 3, or channels 2 and 4 can be overlaid. |
| Display: | Color LCD, 8.5" diagonal. |
| Display colors: | The color of data traces, memory, text, markers and limit lines are all user definable. |
| Trace Overlay: | Displays two data traces on the active channel's graticule simultaneously. |
| Trace Memory: | A separate memory for each channel can be used to store measurement data for later display or subtraction, addition, multiplication or division with current measurement data. |
| Group Delay Range: | The maximum delay range is limited to measuring no more than +180° of phase change within the aperture set by the number of frequency points. |
| Scale Resolution: | Log Magnitude 0.001 dB Linear Magnitude 1 pU Phase 0.01° Group Delay 0.001 ps Time 0.001 ms Distance 0.1 µm WR 1 pU Power 0.01 dB |
| Markers: | Six independent markers can be used to read out measurement data.
Delta Marker: One marker can be selected as the reference for the other five. Enhanced Markers: Marker search feature can be used for finding a level or bandwidth on the active channel. Marker Sweep: Sweeps upward in frequency between any two markers. Recalibration is not required during the marker sweep. |
| Blank Frequency Information: | Blanking function removes all references to frequencies on the display. Frequency references can only be restored through a system reset or GPIB command |
| Vector Error Correction: | There are six built-in methods of calibration: Short-Open-Load-Thru (SOLT): This calibration method uses short circuits, open circuits, and terminations (fixed or sliding). Offset-Short (waveguide): This calibration method uses short circuits and terminations. LRL/LRM: The Line-Reflect-Line (LRL) or Line-Reflect-Match (LRM) calibration uses transmission lines and a reflective device or termination (LRM). TRM: The Thru-Reflect-Match calibration uses short circuits and fixed termination. Three Offset-Short (SSST): This calibration method uses three short circuits with different offset lengths to calculate all the calibration terms. Autocal® : This calibration method uses an automatic calibrator module. |
| Merged Calibrations: | In addition, the Lightning D series VNAs have a Merged Calibration feature that allows the user to merge calibrations performed under different conditions (such as a low frequency SOLT with a band-limited LRL) to cover different frequency bands, provided the total number of points does not exceed 1601 |
| AutoCal: | The VNA can internally control an external AutoCal module to perform a 2-port SOLT calibration. AutoCal is a single two port calibration module with built-in, switched, and characterized SOLT standards. AutoCal provides quick, reliable, and accurate calibrations that exceed the performance of a standard broadband load SOLT calibration. |
| Calibration Standards: | For coaxial calibrations the user can select between SMA, 3.5 mm, GPC-7, Type N, 2.4 mm, TNC, K, V, W1 connector or special type from the calibration menu. Use of fixed or sliding loads can be selected for each connector type. User defined calibration standards allow for entry of open capacitance, load and short inductances, load impedance, and reflection standard offset lengths. |
| Reference Impedance: | It is possible to modify the reference impedance of the measurement to other than 50Ω (but not 0). |
| Adapter Removal Calibration: | Built-in Adapter Removal application software accurately characterizes and "removes" any adapter used during calibration that will not be used for subsequent device measurements. This technique allows for accurate measurement of non-insertable devices |
| Dispersion Compensation: | Selectable as Coaxial (nondispersive), Waveguide, or Microstrip (dispersive). |
| NxN Multiple Device Solutions: | The NxN application provides an accurate method of measuring frequency translated devices, such as mixers, providing both magnitude and phase information and the unique ability to measure absolute phase (group) delay. By measuring the response characteristics of device pairs, the Lightning VNA will solve for device pairs and de-embed the characteristics. The NxN application module for mixer measurements includes capabilities for characterizing the IF path of frequency translation device measurements. The result is a real-time display of the de-embedding characteristics of the device under test. |
| Power Meter Correction: | Power meter correction is available at a userselectable power level, if it is within the power adjustment range of the internal source. This is performed using an external power meter over the Dedicated GPIB port. |
| Multiple Source Control Capability: | Multiple Source Control capability allows a user to independently control the frequencies of two sources and the receiver without the need for an external controller PC. The frequency sweep may be comprised of up to five separate bands, each with independent source and receiver settings, for convenient testing of mixers, multipliers and other frequency translated devices. |
| Set-On Receiver Mode: | For applications that require Harmonics or Intermodulation measurement, the 37000D can be configured to measure the relative harmonic level of test devices with Set-On Receiver Mode capability. The 37000D's unique phase locking scheme allows it to operate as a tuned receiver by locking all of its local oscillators to its internal crystal reference oscillator |
| Embedding/De-embedding: | All 37000D are equipped with an Embedding/De-embedding feature. De-embedding is generally used for removal of test fixture contributions and other S2P networks from measurements. The de-embedding can be applied to a calibration and then stored for future measurements. Similarly, the Embedding function can be used to simulate matching circuits for optimizing amplifier designs or simply adding effects of a known structure to a measurement. |
| Electro-Optical Measurements | |
| E/O Measurements: | The application menus guide the user through the entire calibration and setup. A characterized photodiode (O/E) reference and a laser source are required to complete the test setup. The internal VNA application de-embeds the response of the photodiode reference to allow direct measurement of the bandwidth and return loss of the modulator. |
| O/E Measurements: | Photoreceiver measurements can be made by characterizing a modulator first and then using it as a transfer standard for the O/E measurement. The internal application de-embeds the response of the modulator to allow characterization of the photoreceiver |
| Gain Compression Measurements | |
| Swept Power Gain Compression: | The VNA displays traditional Power out vs. Power in or Phase vs. Power in, at one of up to 10 selectable CW frequencies. A separate screen will easily show Power out and Power in at 1 dB or selected Gain compression for all entered frequencies |
| Swept Frequency Gain Compression: | Once Gain is measured at the starting power, the user increments Power in, observing Normalized Gain vs. Frequency. This aids in analyzing the most critical compression frequencies of a broadband amplifier |
For full Anritsu 37397D Vector Network Analyzer product specifications, please click here: 37397D
Anritsu 37397D Vector Network Analyzer
Installed Option:
- Option 15: Flexible Test Option
Frequency Range: 40 MHz to 65 GHz
Includes Accessories As Listed
BC# -L/T*
Anritsu 37397D 37397-D Vector Network Analyzer Models On Sale Warranty Calibration Backed by The Best Service and Lowest Prices in the Industry.
- Anritsu 37397D Vector Network Analyzer w/ Option: (BC# -L/T*)
- Option 15: Flexible Test Option
- Power Cord
- User Manual On Cd-ROM