Anritsu MP1800A Signal Quality Analyzer Mainframe

Anritsu MP1800A Signal Quality Analyzer

High Quality Instrument Provides Highly Accurate Results

Anritsu’s Signal Quality Analyzer (MP1800A) incorporates a Pulse Pattern Generator (PPG) module for generating the highest-quality, highest-amplitude signals in the industry, as well as an Error Detector (ED) module with the highest input sensitivity available.

The number of channels per MP1800A-series PPG or ED module can be selected from 1ch, 2ch or 4ch, supporting multichannel synchronization for up to 8 channels at 32 Gbit/s. As a result, each channel of AOC, CFP, CXP, QSFP+, etc., modules can be measured simultaneously, enabling crosstalk and skew tolerance evaluation tests.

The MP1800A PPG modules offer outputs up to 3.5 Vp-p, supporting the evaluation of modulators, such as EA and EML. In addition to generating IEEE and ITU-T burst and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, the product’s automated generation of burst data and auxiliary signal output timings shortens evaluation times and improves evaluation quality.

Complete 32G Jitter Testing with Clock Recovery in One Box

Anritsu’s MP1800A with Low-Intrinsic Jitter PPG, 4TAP Emphasis, High-Sensitivity ED, Equalizer for Eye Opening compensation, and automatic measurement software is the ideal total solution for Jitter Tolerance tests.

Various types of jitter, such as SJ, RJ, BUJ, SSC can be generated using the built-in jitter modulation source. The Jitter Modulator generates wide-amplitude SJ up to 1 UI at a Jitter Frequency of 250 MHz, ensuring sufficient margin for receiver Jitter Tolerance tests. Additionally, the Intrinsic Jitter of 275 fs rms (nominal) is extremely low, not only when Jitter modulation is OFF but also when 0 UI is set at Jitter ON, ensuring accurate measurements even at low Jitter amplitudes.

Combining the MP1800A with the 4Tap Emphasis (MP1825B) supports the generation of pre-emphasis for high-speed interconnect standards up to 32.1 Gbit/s, such as CEI-28G, 32G Fibre Channel, and InfiniBand EDR (26G). Each tap can be changed independently assuring accurate pre-emphasis. Positioning the instrument as an external remote head, as close as possible to the DUT, minimizes the impact of signal degradation due to cable-loss and ISI, thus maintaining the highest signal quality at the DUT interface.

The ED module has a high sensitivity of just 10 mV as well as high-speed auto-adjustment of 1 second or less (auto-detects threshold level and phase point), supporting accurate and efficient measurement of low-output-amplitude devices, such as AOCs. Installing the Clock Recovery option enables stress jitter tolerance tests of SERDES with different Tx and Rx clocks and BER measurements of clock-less devices such as AOC in one box.

When used in combination with the High Sensitivity ED (MU183040B/41B) the Passive Linear Equalizers (J1621A/J1622A) enable BER and Jitter Tolerance testing of PHY devices with low EYE openings. The equalizers compensate for printed circuit board (PCB) trace loss and improve EYE opening, thus minimizing the impact of high frequency transmission line distortion.

Ultra High-Speed Signal Generation and BER Measurement

The MP1800A can be configured to generate the high quality, low S/N, 4PAM and 8PAM data signals required for the characterization of high-speed backplanes and 400 GbE interfaces using the 4PAM/8PAM Converter (MZ1834A/MZ1838A). The bit error rates of three 4 PAM eye patterns can be measured simultaneously. The MP1800A is the ideal platform for accurate BER measurements of 4 PAM signals using the long-memory programmable pattern function and error-mask function for filtering out unwanted errors.

With the ability to synchronize up to four MP1800A Signal Quality Analyzer units, only Anritsu supports the configuration of an ultra-high-speed transmission test system up to 1 Tbit/s with multi-channel synchronization signals, such as Quad DP-16QAM and Dual DP-64QAM.

Features:

• Highly expandable, plug-in, modular design bit error rate tester (BERT)
• Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
• Supports signal integrity analysis for a variety of 100G+ applications
  • High speed backplane and interconnect
  • High speed chip/device
  • Active optical cable
  • Optical transceiver modules
• High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
• Jitter tolerance test up to 32.1 Gbit/s
  • SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
  • Support generation of dual tone SJ, RJ, BUJ, and SSC
  • Half Period Jitter (Even/Odd Jitter)
• Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
• 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)

Specifications: