InnovX Omega Xpress XPD-2000 Alloy XRF Analyzer

• Innov X Systems XPD-2000 Handheld Analyzer (BC# 14438)
• Battery Charger w/ AC Adapter
• Standardization Mask/Clip For Unit
• (10) Kapton Windows
• #100276 Cable w/ LEMO
• AC Adapter #RQ-1229MB
• Factory Calibration Certificate
• Omega PC Software 
• (3) Stylus'
• Battery Pack
• Power Cord
• User Manual On CD-ROM
• Hard Carrying Case

 Innov-X Systems XPD-2000 Omega Xpress Handheld XRF Analyzer
Ultimate XRF Performance with Silicon Drift Detector (SDD) Technology
The Innov-X Omega Xpress Analyzer utilizes the latest in detector technology - an innovative, large area Silicon Drift Detector (SDD), commonly used and tested extensively in high end, laboratory based instrumentation. In comparison to a traditional SPiN Diode detector, the SDD provides:
- 10x improvement in signal to background ratio
- Marked resolution improvement, from 195eV to 165eV
- The capacity to handle 10x more counts

Key Benefits:

• >3x improvement in reading speed.
• Light element (Mg, Al, Si, P, S) analysis in air
• 3x better limits of detection for sensitive tramp elements

Greater Speed = More Tests = Improved Bottom Line
With an advanced Innov-X Xpress Series analyzer, testing times can be dramatically reduced to reach the necessary precision for confdent alloy identifcations or quality control specifcation ranges. What used to require a 5-10 second test with a SPiN based analyzer only requires 1-2 seconds with an SDD based Innov-X analyzer! From a customer standpoint, this could translate into hundreds of additional tests per day. From metal sorting and ID in the scrap recycling industry to PMI applications in the petrochemical/refning and power industries, to quality assurance within the automotive, aerospace and general manufacturing industrires, the Omega Xpress Series' superior performance can improve your bottom line.

Omega Xpress Performance Data
The data in Table 1. shows accuracy and precision for the Omega Xpress Alloy Analyzer (in air), testing three different low alloy steels. Results (averages) are calculated using ten, 5 second tests on each material. The Omega Xpress analyzer shows exceptional accuracy and precision.
 

Standard		Ti	Cr	Mn	Ni	Cu	Mo	W
CKD 163e	Certified %	0.090	0.070	0.220	0.070	0.170	0.020
	Measured %	0.124	0.069	0.201	0.090	0.157	0.026
	+/-	0.030	0.010	0.020	0.023	0.018	0.001
CKD 168d	Certified %		0.130	0.810	2.760	0.100	0.560	0.580
	Measured %		0.118	0.721	2.550	0.115	0.526	0.528
	+/-		0.010	0.030	0.080	0.020	0.010	0.050
CKD 165d	Certified %		0.170	1.630	0.150	0.090	0.050
	Measured		0.164	1.527	0.135	0.087	0.054
	+/-		0.010	0.040	0.030	0.011	0.001

Table 2 shows results on a low alloy steel sample, comparing accuracy and precision for 5 second and 20 second long tests. The accuracy and precision reached with the 20 second tests - a longer than normal test for this type of application using an Xpress analyzer - is excellent and may meet QC testing goals in many manufacturing environments.
 

Test Time	CKD 163e	Ti	Cr	Mn	Ni	Cu	Mo
5 seconds	Certified %	0.090	0.070	0.220	0.070	0.170	0.020
	Measured %	0.124	0.069	0.201	0.090	0.157	0.026
	+/-	0.030	0.010	0.020	0.023	0.018	0.001
20 seconds	Certified %	0.090	0.070	0.220	0.070	0.170	0.020
	Measured %	0.083	0.074	0.202	0.064	0.156	0.024
	+/-	0.020	0.006	0.010	0.010	0.010	0.001

For full Olympus XPD-2000 specifications, please click here: Olympus XPD-2000

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