Acterna JDSU EDT-135 E1 and Data Circuit Tester
$699.00
Availability:
In stock
SKU
3L30
Condition: Refurbished / Calibrated
Warranty: 1 YEAR WARRANTY
Shipping: USA & Worldwide
- Acterna EDT-135 E1 and Data Tester (BC# 15420-L/T*)
- (2) BNC To BNC Cables
- AC Adapter/Charger
- Power Cord
- Carrying Case (G)
Request a Quote for
Acterna EDT-135 E1 and Data Tester
BN4562/34 : E1 & Data Tester Without X.50 Testing Interface
Applications
This powerful tester includes a full set of measurements to install, commission and troubleshoot E1 and data circuits, along with the services that run over them.
Installation tests require basic out-of-service Bit Error Rate (BER) testing to assess cabling integrity. Full commissioning requires extended BER testing to international standards, as well as stress testing and complete assessment of link performance with respect to error and alarm reporting.
For successful maintenance, rapid identification of the current line status is critical to the speedy resolution of problems. Specific services (such as Frame Relay and GSM) have their own testing requirements, and require a tailored solution to ensure satisfactory operation.
Functions
Features such as Autoconfigure and the 'Big OK' result screen make it easy to use with a minimum of training. Quality of Service can be measured with G.821, G.826 or M.2100. E1 signal quality measurements include jitter, level and pulse shape. Datacom interface control signals can be monitored and set.
V.24 modem tests include dial-up, autoanswer, distortion measurement and BER. Other important features include round trip delay measurements on E1 and datacom circuits and E1 drop and insert. Comprehensive service testing is possible using dedicated options.
Easy to Use
The EDT-135 has been designed with the user in mind. As well as being lightweight and comfortable to hold and carry, all testers feature large LCD screens with integral backlight for the most demanding testing environments. If you wish to self-support the tester, the integral two-position backstand/carry handle can easily be folded out, and can also be configured to suspend the instrument for hands-free viewing.
Test results are displayed in a concise, graphical format with our recognised 'Big OK' when no errors are present. Multiple language support is standard and comprehensive alarm and error status LEDs give clear indication of problems, even from a distance. And, as you'd expect, all results data can be stored for later analysis or printed to an external printer with a single keypress.
Autoconfigure
The Autoconfigure feature greatly simplifies instrument set-up. A test can be started on framed or unframed traffic using just 2 key-presses. For a framed signal, the instrument can determine the framing type, timeslot allocation and test pattern type.
Gelbrich Synchronization
The patented Gelbrich Synchronization method enables synchronization on a test pattern to be maintained and accurate BER measurement to be made even in the presence of rapid bursts of errors. It also enables differentiation to be made between bit slips and bit errors.
Result Storage and Printing
The EDT-135 has 8 test memories for the storage of text and histogram results, for viewing or printing at a later time. Printing of results is supported through the serial port. A setup screen enables the instrument to be set up for a range of printers.
Programmable Timers
The instrument can be programmed to start a test at a specified date and time for a selectable duration.
Remote Operation
The instrument is compatible with the DTM-32 remote operation solution.
Battery/Mains Operation
8-10 hour battery life using rechargeable and exchangeable batteries. Long duration testing can be achieved with a.c. mains power.
Software Option Download
The testing capability of the EDT-135 can be greatly extended by downloading a range of software options. Applicable options include Signal Level Measurement, Pulse Shape Analysis, Jitter, Large Frequency Offset of Transmit Clock, Frame Relay, HCM, GSM, Enhanced Datacom Tests and Voice Channel Noise Measurement.
Instrument Applications
E1 Service Turn-up
Availability and performance of an E1 link can be established using either an intrusive or a non-intrusive test. The EDT-135 can be connected via 75/120 connectors using Hi-Z termination or at a protected monitor point. A typical simple E1 test will take no longer than 30 seconds, the OK screen quickly indicates when an E1 service is present and error-free. G.826/M.2100 test sequences can then be run, and the results displayed, stored and printed.
n x 64kbit/s Timeslot Analysis
64kbit/s timeslots are grouped within the E1 frame to give endcustomers intermediate data speeds such as 128 or 256kbit/s. The EDT-135 can perform BER analysis on bundles of n x 64kbit/s slots, and drop and insertn x 64 kbit/s to an external protocol analyser via V.11.
G.826 and M.2100 Analysis
G.826 is the ITU-T recommendation for error performance of international digital paths at or above the Primary Rate. The complementary M.21xx series permits rigorous testing of PDH links but in shorter time periods. Both methods are included as standard software modules in the EDT-135 tester. The following screens illustrate the summary results from G.826 and M.2100 tests.
E1 Service Troubleshooting
An extended bit error test will determine whether a periodic fault is causing problems. Electrical equipment such as airconditioning may cause problems at regular times in the day. Error histograms make it possible to identify external events which can be isolated as causes of the problem.
Faults in an E1 line can be caused by low signal, pulse distortion or jitter.
If loss of signal (LOS) or similar alarms are indicated by a network element, level measurement and pulse shape tests can easily be made to determine where the fault exists in a link, by examining the signal condition.
A low or distorted signal received by a network element would indicate a problem with the preceding element or the interconnecting cables.
Excessive jitter can result in bit errors, loss of frame synchronization or similar faults. Where these faults exist, jitter measurements can be performed to determine if jitter is the cause, and also to discover at which point in the system the jitter reaches unacceptable levels.
Technical Specifications
For full Acterna EDT-135 specifications, please click here: Acterna EDT-135
BN4562/34 : E1 & Data Tester Without X.50 Testing Interface
Applications
- Installing, commissioning and maintaining E1 circuits and multiplexers
- Commissioning and maintainng datacom and V.24 modem circuits
- Commissioning Frame Relay services
- Installing and maintaining GSM circuits
This powerful tester includes a full set of measurements to install, commission and troubleshoot E1 and data circuits, along with the services that run over them.
Installation tests require basic out-of-service Bit Error Rate (BER) testing to assess cabling integrity. Full commissioning requires extended BER testing to international standards, as well as stress testing and complete assessment of link performance with respect to error and alarm reporting.
For successful maintenance, rapid identification of the current line status is critical to the speedy resolution of problems. Specific services (such as Frame Relay and GSM) have their own testing requirements, and require a tailored solution to ensure satisfactory operation.
Functions
- E1 and n x 64k BERT with Autoconfigure and G.821, G.826 and M.2100 testing
- Clear OK/Status Page
- Multi-interface capability: V.24/RS232, V.11/X.24, V.35, V.36/RS449, G.703 (2048/704kbit/s), G.703 co-directional
- Frame Relay commissioning tools, turn-up, PING and Fox
- Multiplexer tests include MUX/ DEMUX and A-D/D-A measurements
- Special sub-rates (HCM, X.50, V.110)
Features such as Autoconfigure and the 'Big OK' result screen make it easy to use with a minimum of training. Quality of Service can be measured with G.821, G.826 or M.2100. E1 signal quality measurements include jitter, level and pulse shape. Datacom interface control signals can be monitored and set.
V.24 modem tests include dial-up, autoanswer, distortion measurement and BER. Other important features include round trip delay measurements on E1 and datacom circuits and E1 drop and insert. Comprehensive service testing is possible using dedicated options.
Easy to Use
The EDT-135 has been designed with the user in mind. As well as being lightweight and comfortable to hold and carry, all testers feature large LCD screens with integral backlight for the most demanding testing environments. If you wish to self-support the tester, the integral two-position backstand/carry handle can easily be folded out, and can also be configured to suspend the instrument for hands-free viewing.
Test results are displayed in a concise, graphical format with our recognised 'Big OK' when no errors are present. Multiple language support is standard and comprehensive alarm and error status LEDs give clear indication of problems, even from a distance. And, as you'd expect, all results data can be stored for later analysis or printed to an external printer with a single keypress.
Autoconfigure
The Autoconfigure feature greatly simplifies instrument set-up. A test can be started on framed or unframed traffic using just 2 key-presses. For a framed signal, the instrument can determine the framing type, timeslot allocation and test pattern type.
Gelbrich Synchronization
The patented Gelbrich Synchronization method enables synchronization on a test pattern to be maintained and accurate BER measurement to be made even in the presence of rapid bursts of errors. It also enables differentiation to be made between bit slips and bit errors.
Result Storage and Printing
The EDT-135 has 8 test memories for the storage of text and histogram results, for viewing or printing at a later time. Printing of results is supported through the serial port. A setup screen enables the instrument to be set up for a range of printers.
Programmable Timers
The instrument can be programmed to start a test at a specified date and time for a selectable duration.
Remote Operation
The instrument is compatible with the DTM-32 remote operation solution.
Battery/Mains Operation
8-10 hour battery life using rechargeable and exchangeable batteries. Long duration testing can be achieved with a.c. mains power.
Software Option Download
The testing capability of the EDT-135 can be greatly extended by downloading a range of software options. Applicable options include Signal Level Measurement, Pulse Shape Analysis, Jitter, Large Frequency Offset of Transmit Clock, Frame Relay, HCM, GSM, Enhanced Datacom Tests and Voice Channel Noise Measurement.
Instrument Applications
E1 Service Turn-up
Availability and performance of an E1 link can be established using either an intrusive or a non-intrusive test. The EDT-135 can be connected via 75/120 connectors using Hi-Z termination or at a protected monitor point. A typical simple E1 test will take no longer than 30 seconds, the OK screen quickly indicates when an E1 service is present and error-free. G.826/M.2100 test sequences can then be run, and the results displayed, stored and printed.
n x 64kbit/s Timeslot Analysis
64kbit/s timeslots are grouped within the E1 frame to give endcustomers intermediate data speeds such as 128 or 256kbit/s. The EDT-135 can perform BER analysis on bundles of n x 64kbit/s slots, and drop and insertn x 64 kbit/s to an external protocol analyser via V.11.
G.826 and M.2100 Analysis
G.826 is the ITU-T recommendation for error performance of international digital paths at or above the Primary Rate. The complementary M.21xx series permits rigorous testing of PDH links but in shorter time periods. Both methods are included as standard software modules in the EDT-135 tester. The following screens illustrate the summary results from G.826 and M.2100 tests.
E1 Service Troubleshooting
An extended bit error test will determine whether a periodic fault is causing problems. Electrical equipment such as airconditioning may cause problems at regular times in the day. Error histograms make it possible to identify external events which can be isolated as causes of the problem.
Faults in an E1 line can be caused by low signal, pulse distortion or jitter.
If loss of signal (LOS) or similar alarms are indicated by a network element, level measurement and pulse shape tests can easily be made to determine where the fault exists in a link, by examining the signal condition.
A low or distorted signal received by a network element would indicate a problem with the preceding element or the interconnecting cables.
Excessive jitter can result in bit errors, loss of frame synchronization or similar faults. Where these faults exist, jitter measurements can be performed to determine if jitter is the cause, and also to discover at which point in the system the jitter reaches unacceptable levels.
Technical Specifications
Generator/ Receiver | Interfaces: G.703 Outputs: Balanced 3 pin CF connector Unbalanced BNC connector |
G.703 Test Modes: RX |
Framing: PCM30, PCM30CRC, PCM31, PCM31CRC, or Unframed G.703 line code: HDB3, AMI, co-directional V.11 drop: 1 x 64kbit/s, n x 64kbit/s |
RX/TX | As RX plus: BER Test pattern generation: Single timeslot n x 64kbit/s timeslots V.11 Drop/Insert: Drop and/or Insert n x 64kbit/s timeslots Drop and Insert 1 timeslot Programmable Si, Sa, A and E bits and NMFAS |
Through Mode | As RX/TX plus Drop and/or Insert via V.11 |
Round Trip Delay | Framed and Unframed 2Mbit/s |
MUX and DEMUX Testing | Receiver and transmitter as for RX/TX modeUnframed TX and RX on V interfaces or G.703 co-directional |
Framed Monitor | Monitor and display of: FAS, NFAS, MFAS, NMFAS, and CRC MFAS words 8-bit digital code word in any selected timeslot, CAS status of all 30 channels with idle/busy indication |
Level and Frequency | Digital generation/measurement of sinusoidal signals in a timeslot. (A-law coding to ITU-T Rec. G.711) |
X.50 Test Modes | Interfaces: V.11, V.35, V.36, RS449 and G.703 co-directional |
Test Patterns | PRBS: 26-1, 29-1, 211-1, 215-1, Alternating 1 and 0s, All 1s, All 0s, 8 and 16 bit programmable word |
Error Injection | Bit, Code, FAS, CRC errors: Single, ratio or frequency |
Clocking | G.703 transmit clock source 2048kbit/s and co-dir: Internal, External, From RX |
Error and Alarm Indication | LEDs: 2 summary, 14 alarm/error, option, low battery |
Printer and Remote Operation | Interface: V.24, DTE, Async Baud rates: 300, 600, 1200, 2400, 9600, 19200, 38400 |
Front Panel | Display: 42 character x 16 line LCD, LED back-light Keyboard: Numerical keypad, 4 Cursor, 2 Contrast,Main Menu, 6 Softkeys, Alt, On and Off |
Stores/Memory | 8 test result memories and 8 configuration stores |
Self Check | Comprehensive self check at power on |
Languages | English, German, French, Spanish, Italian, Turkish and Portuguese |
Power Supply | External supply: External mains charger Rechargeable batteries: 8 to 10 hours operating time Battery low: warning before auto switch off |
For full Acterna EDT-135 specifications, please click here: Acterna EDT-135