Keithley 2400 High Precision Source Meter 200V SMU
Condition: Refurbished/Calibrated
Warranty: 1 Year Warranty
Shipping: USA & Worldwide
- Keithley 2400 Source Meter (BC# -L/T*)
- Power Cord
- User Manual On CD-ROM
Keithley 2400 High Precision Source Meter
Key Features
- Five instruments in one (IV Source, IVR Measure)
- Five models: 20–100 W DC, 1000 W pulsed,1100 V to 1 μV
- Source and sink (4-quadrant) operation
- 0.012% basic measure accuracy with 6½-digit resolution
- 2-, 4-, and 6-wire remote V-source and measure sensing
- 1700 readings/second at 4½ digits via GPIB
- Pass/Fail comparator for fast sorting/binning
- Programmable DIO port for automation/handler/prober control (except 2401)
- Standard SCPI GPIB, RS-232 and Keithley Trigger Link interfaces
Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities.
Each SourceMeter SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise.
The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter SMU instruments invaluable for a wide range of characterization and production test applications.
Advantages of a Tightly Integrated Instrument
By linking source and measurement circuitry in a single unit, these instruments offer a variety of advantages over systems configured with separate source and measurement instruments. For example, they minimize the time required for test station development, setup, and maintenance, while lowering the overall cost of system ownership. They simplify the test process itself by eliminating many of the complex synchronization and connection issues associated with using multiple instruments. And, their compact half-rack size conserves precious “real estate” in the test rack or bench.