Keithley 2602B Dual Channel Source Meter

Keithley 2602B Dual Channel System Source Meter

The Series 2600B System Source Meter SMU Instruments are the industry’s leading current/voltage source and measure solutions, and are built from Keithley’s third generation SMU technology. The Series 2600B offers single- and dual-channel models that combine the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator, and electronic load – all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity in applications ranging from bench-top I-V characterization through highly automated production test. Built-in web browser based software enables I-V testing through any computer from anywhere in the world or, use your Android smart device to perform plug & play I-V testing with fingertip control with the Keithley IVy application. For automated system applications, the Series 2600B’s Test Script Processor (TSP ®) runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, Keithley’s TSP-Link ® Technology works together with TSP Technology to enable high-speed, SMU-per-pin parallel testing. Because Series 2600B SourceMeter SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily reconfigured and re-deployed as your test applications evolve.

Key Features

• Tightly integrated, 4-quadrant voltage/current source and measure instruments offer best in class performance with 6½-digit resolution
• Family of models offer industry’s widest dynamic range: 10A pulse to 0.1fA and 200V to 100nV.
• Built-in web browser based software enables remote control through any browser, on any computer, from anywhere in the world.
• Compatibility with the Keithley IVy mobile app enables true plug & play I/V characterization and test through any Android device.
• TSP (Test Script Processing) technology embeds complete test programs inside the instrument for best- in-class system-level throughput.
• TSP-Link expansion technology for multi-channel parallel test without a mainframe.
• Software emulation for Keithley’s 2400 SourceMeter SMU Instrument.
• USB 2.0, LXI-C, GPIB, RS-232, and digital I/O interfaces.
• Free software drivers and development/debug tools.
• Optional ACS-Basic semiconductor component characterization software.

Perform Quick I-V Characterization with Android™ Devices

The Series 2600B is compatible with the Keithley Ivy application that is the fastest and easiest way to perform current-voltage (I-V) characterization, troubleshoot your device under test (DUT), and share the measurement results with others. It allows you to visualize, interact with, and share measurement results without programming, while gaining a deeper understanding of your DUT. These unique capabilities boost productivity across a wide range of applications in R&D, education, QA/FA, and more.

Unmatched Throughput for Automated Test with TSP Technology

For test applications that demand the highest levels of automation and throughput, the 2600B’s TSP technology delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers — it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates all the time-consuming bus communications to and from the PC controller, and thus dramatically improves overall test times.

SMU-Per-Pin Parallel Testing with TSP-Link Technology

TSP-Link is a channel expansion bus that enables multiple Series 2600B’s to be interconnected and function as a single, tightly-synchronized, multi-channel system. The 2600B’s TSP-Link Technology works together with its TSP technology to enable high-speed, SMU-per-pin paralleltesting. Unlike other high-speed solutions such as large ATE systems, the 2600B achieves parallel test performance without the cost or burden of a mainframe. The TSP-Link based system also enables superior flexibility, allowing for quick and easy system re-configuration as test requirements change.

2400 Software Emulation

The Series 2600B is compatible with test code developed for Keithley’s 2400 Source Meter SMU instrument. This enables an easier upgrade from 2400-based test systems to Series 2600B, and can improve test speeds by as much as 80%. In addition, it provides a migration path from SCPI programming to Keithley’s TSP technology, which when implemented can improve test times even more. For complete support of legacy test systems, the 2400’s Source-Memory- List test sequencer is also fully supported in this mode.

Third-generation SMU Instrument Design Ensures Faster Test Times

Based on the proven architecture of earlier Series 2600 instruments, the Series 2600B’s SMU instrument design enhances test speed in several ways. For example, while earlier designs used a parallel current ranging topology, the Series 2600B uses a patented series ranging topology, which provides faster and smoother range changes and outputs that settle more quickly. The Series 2600B SMU instrument design supports two modes of operation for use with a variety of loads. In normal mode, the SMU instrument provides high bandwidth performance for maximum throughput. In high capacitance (high-C) mode, the SMU instrument uses a slower bandwidth to provide robust performance with higher capacitive loads.

Simplify Semiconductor Component

The optional ACS Basic Edition software maximizes the productivity of customers who perform packaged part characterization during development, quality verification, or failure analysis. Key features include:
• Rich set of easy-to-access test libraries
• Script editor for fast customization of existing tests
• Data tool for comparing results quickly
• Formulator tool that analyzes captured curves and provides a wide range of math function