Olympus BTX II Portable Benchtop Mining XRD Analyzer

Olympus BTX II Portable Benchtop Mining XRD Analyzer

The BTX II Benchtop X-ray Diffraction/X-ray Fluorescence is, simply put, the first combined XRD/XRF instrument designed with ease of use in mind. From educational settings, to the rigors of a QC application, BTX II is well suited. Based on the filled proven reliable design of TERRA, our field portable XRD/XRF instrument, BTX II features the same level of performance, but without the aspects of a portable instrument. 

The BTX II is a compact combination XRF/XRD system designed for powder analysis. Now XRD work can really be done in an easy to use, small footprint, low cost configuration. With the BTX II patented sample handling system, not only is sample preparation time minimized, but accuracy in peak identification previously only available using large and expensive laboratory based systems can now be achieved.

Features: 

• Self-contained instrument
• Very simple sample preparation
• loose powders (~20mg of sample)
• sieve sample to <150µm
• Easy to use, single button operation
• True 2D powder XRD instrument provides image of XRD pattern
• See particle influences or preferred orientation
• Energy discrimination X-ray detector
• Eliminate Fluorescence, scatter and other background
• XRF spectral data for pattern confirmation

Typically, XRD experiments require a finely ground sample which is then pressed into a pellet. This requirement is formed by the need to ensure sufficient random orientation of the crystals in the sample. BTX II introduces a patented new way of addressing this issue. With only 15 mg of sample, BTX II convects the sample with its integrated sample vibration chamber. By doing so, BTX II is able to present all different orientations of the crystal structure to the instrument optics. This results in a superb XRD pattern, virtually free of problematic preferred orientation effects found using more classic preparation methods.

Software:

BTX II is shipped with the necessary software (XPowder) for processing the resulting X-ray diffraction data. This includes the AMCSD mineral database. For quantitative analysis, XPowder comes complete with reference intensity ratio (RIR) quantitative analysis methods as well as full-pattern analysis tools. Furthermore, BTX II provides XRD pattern data in a variety of file formats, making XRD pattern interpretation in third-party programs easily accessible.

Specifications: