Olympus OmniScan X3 PA 16:64 Ultrasonic Flaw Detector Phased Array

Olympus OmniScan X3 Ultrasonic Flaw Detector 

The Olympus OmniScan X3 Phased Array Ultrasonic Testing / PAUT Flaw Detector is a reliable device capable of performing a variety of functions. The combination of the OmniScan X3 flaw detector’s live total focusing method (TFM) envelope processing, up to 1,024 × 1,024 grid resolution, and vibrant color display make its TFM images stand out with exceptional detail. Defects appear sharp and clear with high resolution. The Olympus OmniScan X3's Acoustic Influence Map (AIM) tool provides an instant visual model of the sensitivity based on mode, settings, and simulated reflector. The tool can visualize the effect of a wave set (in TFM mode), see where sensitivity stops, and adjust the scan plan accordingly.


The improved Phase Array of the Olympus OmniScan X3 Flaw Detector is quick and efficient featuring 800% high amplitude range which reduces the need to rescan. This detector is compatible with existing files, setups, probes, and scanners from MX/MX2/SX models to compare old and new data as well as changes over time. The OmniScan X3's 25 GB maximum file size enables to continuously scan large components without stopping. With IP65 rain and dust proof certification, GPS to record the location of data obtained, and wireless connectivity, the Olympus OmniScan X3's uses are varied and plentiful.


Features:

• 3 Times as fast as the Omniscan MX2 Flaw Detector
• Single time of flight diffraction(TOFD) menu for accelerated workflow
• Improved fast phased array calibration
• 800% high amplitude range reduces the need for rescan
• Compatible with existing probes and scanner