Oxford Instruments X-MET5100 Handheld XRF Analyzer

• Oxford Instruments X-MET5100 Handheld XRF Analyzer (BC# -L/T*)
• AC Adapter/Charger
• Carrying Case (G)

Oxford Instruments X-MET5100 Handheld XRF Analyzer

The Oxford Instruments X-MET5100 Handheld XRF Analyzer is a portable instrument used to identify the elemental composition of materials. XRF stands for X-ray fluorescence. It allows users to analyze samples on-site, making it useful for metal identification, quality control, scrap sorting, and material verification.

The analyzer directs X-rays at a sample, causing its elements to emit characteristic secondary X-rays. By measuring their energies and intensities, the instrument identifies elements and estimates their concentrations. This technique generally leaves the sample intact and can produce results within seconds, depending on the material and measurement requirements.

The X-MET5100 combines a 45 kV X-ray tube with a silicon drift detector. This configuration enables measurement of light elements such as magnesium, aluminum, and silicon without vacuum pumps or helium attachments. That capability helps distinguish alloys whose grades depend on differences in these elements.

A major application is positive material identification, or PMI, which checks whether a metal matches the expected composition. Recycling operators also use it to separate valuable alloy grades. With suitable calibrations and sample preparation, the X-MET5100 can additionally screen soils and other materials for heavy-metal contamination.

Designed for field use, the analyzer offers battery operation, an integrated computer interface, and stored results for reporting. Its IP54-rated housing provides protection against dust and splashing water. Measurement quality depends on the calibration, sample condition, and testing time, so users select the appropriate analysis method for their materials.

Features:

• Non-destructive elemental analysis — identifies material composition without cutting or damaging the sample.
• 45 kV X-ray tube for material analysis.
• Silicon drift detector (SDD) for fast measurements and low detection limits.
• Light-element detection, including magnesium, aluminum, and silicon, without helium or vacuum attachments.
• Rapid alloy identification for positive material identification (PMI), quality control, and scrap sorting.
• Trace-element measurement at parts-per-million levels, depending on the element, sample, and calibration.
• Calibration using certified reference materials for traceable results.
• Programmable pass/fail mode and alarms.
• Touchscreen interface with an integrated PDA computer.
• Data storage and reporting for documenting results.
• Rechargeable battery operation for portable use.
• IP54-rated housing for dust and splash protection.
• Optional weld collimator for analyzing narrow welds down to approximately 2 mm.