Tektronix TDS 7104 4 Channel 1GHz Bandwidth 10 GSa/s Oscilloscope

Tektronix TDS 7104 4 Channel Oscilloscope

Features & Benefits

• Down to 100 ps Rise Time
• 4 GHz, 2.5 GHz, 1.5 GHz, 1 GHz and 500 MHz Bandwidth Models
• Up to 20 GS/s Real-time Sample Rate
• Up to 32 Megasamples Memory Depth
• >400,000 Wfms/second Maximum Waveform Capture Rate
• Exceptional Delta-time Accuracy for High-confidence in Critical Timing Measurements
• Communications Mask Testing Up to 2.5 Gbps Rates
• Clock Recovery from Serial Data Streams
• 32-Bit Serial Trigger for Isolation of Pattern-dependent Effects
• 10 MHz Time base Reference Input for Enhanced Accuracy and Repeatability
• MultiView Zoom for Quick Navigation of Long Records
• Control via Classic Direct Controls, Touch-sensitive Color Display or Mouse Navigation
• Open Microsoft Windows Environment

Applications

• Signal Integrity, Jitter and Timing Analysis
• Verification, Debug and Characterization of Sophisticated Designs
• Design Development and Compliance Testing of Serial Data Streams Up to 2.5 Gbps Rates for Telecom and Datacom Industry Standards
• Debugging Telecom, Datacom and Storage Area Network Equipment Designs and High Speed Backplanes
• Spectral Analysis
• Disk Drive Analysis
• Investigation of Transient Phenomena

Unmatched Performance, Simplicity and Connectivity

TDS7000 Series digital phosphor oscilloscopes provide the industry’s best solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs. The family features exceptional signal acquisition and analysis, operational simplicity and complete connectivity to your design environment and third party analysis software. The intuitive user interface, developed after months of customer research, was pioneered in the TDS7000 Series and is quickly becoming an industry standard.

Superior Performance Solves Signal Integrity Problems and Speeds Verification and Debug

Signal Fidelity

TDS7000 models, with bandwidths from 500 MHz to 4 GHz and single-shot sample rates to 20 GS/s, easily meet the demands of the latest high-speed logic families and multi-Gigabit communication standards. Acquisition memory up to 32 Megasamples maximizes the value of the high sample rate and ensures that critical events are captured with fine detail. Exceptional deltatime measurement performance provides dependably accurate measurements of the time interval between two events. And, the combination of exceptional trigger and acquisition performance, deep memory and application-specific software make the TDS7000 Series a high-performance jitter and timing analysis tool.

Superior probing performance is critical the fidelity of your measurement system. The P7260 6 GHz active probe faithfully acquires real-time signal information from high-speed designs with high-impedance, high-frequency circuit elements that demand minimal loading. The P7350 5 GHz differential probe provides high CMRR, broad frequency range, and minimal time skew between inputs.

The TDS7154, TDS7254 and TDS7404 models include the TekConnectTM signal interconnect system, which further ensures superior signal fidelity, while offering unparalleled versatility with the world’s widest array of accessory signal acquisition solutions for high-performance, real-time oscilloscopes. This convenient, positive locking interface replaces the traditional BNC connectors and is compatible with the P7000 Series probes. The TCA-1 MEG high-impedance buffer amplifier allows you to make high-voltage and micro-volt differential, current and other general purpose voltage measurements using existing Tektronix probing solutions that require a 1 MΩ termination. In addition, this amplifier provides input coupling (AC/DC/GND) and bandwidth limit (100 MHz, 20 MHz).

Waveform Capture Rate

The successful discovery of intermittent faults and characterization of complex, dynamic signals depend on the amount of time the signal is observed by the oscilloscope. With the TDS7000 Series you can fully visualize signal activity, because third-generation digital phosphor technology (DPXTM ) provides waveform capture rates of more than 400,000 waveforms per second. DPX has saved countless designers minutes, hours, or even days, by quickly revealing the nature of faults so you can apply the TDS7000’s sophisticated triggering to isolate them.

Application-specific Extensions

Optional application-specific measurement and analysis packages extend TDS7000 capabilities. These packages build on the precision acquisition performance of the TDS7000 Series to address the need for application-specific measurements to quickly quantify device and system performance.

Applications include:

• Advanced jitter and timing analysis, including Rj/Dj separation, for high speed clock and data signal characterization
• Compliance testing for signaling defined in ITU-T G.703 and ANSI T1.102 communications standards
• Compliance testing for signaling defined in USB1.0 standard and USB2.0 draft standard
• Disk drive read channel, head and media measurements to IDEMA standards; PRML measurements
• Power measurement and analysis
• Compliance testing for 10Base-T, 100Base-TX, and 1000Base-T signals

Why is Delta-time Accuracy a Critical Specification?

Accurate time interval (delta-time) measurements are critical when validating and characterizing design performance. New standards such as PCI Express, HyperTransport and InfiniBand operate at extreme clock speeds and timing margins. Deltatime accuracy is the most important specification for timing measurements because it determines how close these measurements will be to the real values. It takes into account both repeatability and resolution specifications and includes effects from both the horizontal and vertical systems. Delta-time accuracy specifies the deviation from the actual value. It is based upon a number of factors, including sample interval, quantization error, interpolation error, amplifier noise, time base accuracy and sample clock jitter. Because each of these factors contributes to the timing error, the combination of them determines the delta-time accuracy specification. While individual factors such as time base accuracy or sample interval are important, it is the aggregate performance of the entire digitizing system that determines measurement accuracy. Thus, delta-time accuracy is a critical specification for applications such as setup and hold time verification, characterization of skew and jitter analysis where timing is the fundamental characteristic being measured.

Operational Simplicity

Intuitive User Interface

The TDS7000 Series graphical user interface delivers sophisticated capability to advanced users without intimidating occasional users. The front panel includes a complete set of classic analog-style controls for most commonly used features. The combination of a large 10.4 in. (264 mm) touch sensitive display and graphical interface creates a highly visual environment with explicit illustration of instrument features. The waveform display area remains visible even when control windows are displayed, so you won’t miss changes in the waveform when making selections or adjustments. Context-sensitive Help supplements graphic control windows and makes it easy to apply advanced capabilities to solve problems.

The adaptable TDS7000 Series human interface readily supports any operating style and environment. Select traditional instrument-style buttons for navigation or switch to a Microsoft Windows menu bar. You can use the touch screen or a mouse to drag waveform positions, cursor locations and trigger levels. Easily select a waveform area for zooming, histogram analysis or measurement gating using a graphical drag box. Add a mouse, keyboard or other peripherals without powering off the instrument with the USB interface.

Serial Communications Signal Analysis

The serial mask testing option (Option SM) and the serial trigger option (Option ST) add powerful features for the analysis and testing of serial communications signals, including:

• Mask testing
• Clock recovery
• Waveform database acquisition
• Eye pattern measurements
• Serial pattern triggering

Mask Testing

Option SM provides a complete portfolio of masks for verifying compliance to serial communications standards up to 2.5 Gbps rates. Easily tailor mask testing to your specific requirements:

• One-button mask autoset
• Auto-fit process minimizes hits
• Mask margin control adjusts tolerance during testing
• Hit-counting identifies location and degree of failures
• Test-related actions including notification, logging and hardcopy
• Built-in mask editing

The TDS7000 includes masks for a wide range of electrical standards, plus optical standards for use with external optical reference receivers (ORR) or O/E converters.*¹

Clock Recovery

Option SM*² includes clock recovery for serial data streams from 1.5 Mbaud to 2.5 Gbaud. With a single connection, trigger on data or recovered clock to identity clock to- data jitter.

Communications Measurements

Option SM also adds a broad suite of eyepattern related measurements fundamental to analysis of serial communications signals, including eye width, eye height, jitter, noise and extinction ratio. These are built on the waveform database acquisition mode which provides information over a much larger sample of data, ensuring stable and accurate results.

*¹ The CSA7000 Series of real-time communication signal analyzers includes optical input, ORR filters, clock recovery and serial pattern trigger to provide a versatile solution for verifying compliance to optical and electrical communications standards.

*² Available on TDS7154, TDS7254, TDS7404 only.

Serial Pattern Trigger

Option ST*² provides hardware-based serial pattern trigger to discriminate patterns within serial data streams and analyze pattern dependent issues, even on a singleshot basis. Specify patterns with up to 32 bits, including don’t care bits. You gain single connection convenience by applying internal clock recovery. Or, clock the serial trigger system from an external source.

External Time Base Reference

Match stability or synchronize multiple instruments by phase-locking the reference oscillator to an external 10 MHz source. You can also use this phase-lock technique to characterize very low frequency wander and modulation effects.

MultiView Zoom

Use the MultiView zoom to select areas of specific interest, without losing the “big picture” or rapidly navigate and compare multiple waveform regions. With MultiView zoom, lock the relative positions of the selected areas together and scroll through deep records manually or automatically. Control MultiView zoom directly with knobs or the graphical user interface.

Parametric Measurements

The TDS7000 includes a complete parametric measurement system for signal characterization. Select your measurement choice directly from a graphical palette. The ability to quickly reassign measurements to a different waveform simplifies verification tasks. Split cursors and screen cursors make it easy to measure trace-to-trace timing characteristics. You can gather measurement statistics for deeper insight, and measurement results for inclusion in a document or analysis in a spreadsheet.

Powerful Math

With the TDS7000 Series, you can quickly transform raw waveform data into powerful information that is readily interpreted. Define and apply math expressions to waveform data for on-screen results in terms that you can use. Access common waveform math functions with the touch of a button. For advanced applications, create algebraic expressions consisting of waveform sources, math functions, measurement values and scalars with an easy-to-use calculator-style editor.

Enhanced Spectral Analysis

The TDS7000 Series includes a unique spectrum-analyzer style interface for performing frequency domain analysis. Controls such as center frequency, frequency span, resolution bandwidth and reference level provide access to wide or narrow-band frequency, phase and group delay information. A gating function allows you to select only a portion of the time-domain signal for analysis.

Complete Connectivity Adds Virtually Unlimited Analysis Capability

The connectivity of a TDS7000 Series oscilloscope means you can easily document waveforms and test results, enjoy open access to your work environment, run sophisticated third-party analysis software and even create your own customized software programs directly on your oscilloscope.

Built-in applications such as WordPad, Paint and Internet Explorer concurrently maintain lab notes and reference design information while working with the instrument, saving time and reducing errors. Standard network interfaces make file sharing and transporting results easy.

Advanced Waveform Analysis Made Easy

A comprehensive software infrastructure results in faster, more versatile operations. Move waveform data directly from the acquisition system to analysis applications quickly and easily. Industry-standard protocols, such as VISA and ActiveX Controls, simplify use of Windows applications such as Excel for data analysis and documentation. Or, create custom software to automate multi-step processes in waveform collection and analysis with Visual BASIC, C, C++, MATLAB, HP VEE, and other common development environments.

The TDS7000 Series also supports integration with external PCs and non-Windows hosts. Plug-and-play drivers enable fast and easy communication with LabVIEW, Lab Windows and HP VEE programs using GPIB and LAN connections. Connect applications on a local area network directly to a TDS7000 Series using the included VXI 11.2 server.

View the Microsoft Windows Desktop on a Separate Monitor

TDS7000 can also be expanded with the addition of an external monitor. In dual-monitor mode, the instrument retains live oscilloscope displays while other applications such as publishing, analysis or browsing tools reside on the external monitor.

Observe How the Digital and Analog Worlds Interact

Connecting your oscilloscope to a Tektronix logic analyzer gives you an integrated measurement solution that captures and displays both digital and analog domains in a single time-correlated view.

Use the breakthrough P6860/80 connectorless logic analyzer probe to make both digital and analog measurements.